NanoWorld AFM probes

Switzerland based NanoWorld AG, a leading manufacturer of innovative high quality probes for Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM), is supplying major AFM manufacturers since many years. The wide selection of tip shapes, spring constants, resonant frequencies and coatings results in the most appropriate probe for research as well as industrial applications.

The Silicon AFM probes of the Pointprobe® series are the most widely used and best known AFM probes worldwide and have become the standard probes in many labs.

The silicon probes of the Arrow™ series feature a unique tip shape that allows easy positioning of the tip on the area of interest. A version resonating with an ultra-high frequency of up to 1.5 MHz for high speed scanning is also available.

The PNP Silicon Nitride probes are available in several variations ranging from rectangular to triangular cantilevers with silicon nitride tips with less than 10 nm tip radius to tipless cantilevers and tips with (top side or both sides) or without gold coating.

A new probes series of ultra-short cantilevers dedicated for High Speed AFM (HS-AFM) is currently being prepared for introduction.
 
www.nanoworld.com

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