AFM Probe type:


Manufacturer: NANOSENSORS
Product Description:

Novel self-sensing and self-actuating (-exciting) probe for dynamic mode Atomic Force Microscopy (AFM)

Akiyama-Probe is based on a quartz tuning fork combined with a micromachined cantilever. The great advantage of this novel probe is that one can benefit from both the tuning fork's extremely stable oscillation and the silicon cantilever's reasonable spring constant with one probe.

Akiyama-Probe is equipped with a special version of the NANOSENSORS™ AdvancedTEC, a high-end sharp silicon tip and has an excellent imaging capability on various samples with different properties, which is as high as that of a conventional optical lever system.

Akiyama-Probe requires neither optical detection, nor an external shaker. Akiyama-Probe occupies only a small volume above the sample. These features make it very attractive for creating a new generation of scanning probe microscopy (SPM) instruments.

Application Modes:
AFM Probe Specifications:
AFM Tips:
shape tip height tip set back tip radius full cone angle half cone angle
Visible 28 µm < 15 nm

AFM Cantilever(s):
cant. shape length width thickness force const. res. freq. probe base
Double beam 310 µm 30 µm 3.7 µm 5 N/m 50 kHz

Probes Datasheets:
Datasheet provided for all Akiyama-Probes.
Available Packages
Order Code Probes per set
A-PROBE-10 10 pcs

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esd kit

DANGER: One tiny amount of static electricity while you are handling these probes will destroy the tip!

We highly recommend that you utilize an ESD station and if you do not already have one, we have a mobile ESD station for only £ ( EUR).
Considering the costs of these probes, this is a very wise investment.

Click here to order: ESD Kit