More than 20 years ago NANOSENSORS™ was the first company to commercially manufacture batch fabricated silicon AFM probes. NANOSENSORS™ still is the worldwide technology leader, using its long experience to provide the most consistent AFM probes quality, year by year, batch by batch, wafer by wafer, probe by probe, tip by tip. Everywhere where consistent quality and reproducible results are necessary NANOSENSORS™ AFM probes are the probes of choice.

NANOSENSORS™ offers the widest selection of high quality standard and specialized AFM probes, customized AFM tips on demand as well as calibration standards and alignment chips for scanning probe microscopy.


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Application Modes:

  • Non-Contact / Tapping Mode AFM Probes
  • Force Modulation (FM) AFM Probes
  • Contact Mode AFM Probes
  • Life Science AFM Probes
  • Ultra High Frequency AFM Probes
  • Conductive AFM Probes
  • Magnetic AFM Probes
  • Supersharp AFM Probes
  • Diamond AFM Probes
  • Hardened / Enhanced Wear Resistance AFM Probes
  • Nanoindentation and Lithography AFM Probes
  • High Aspect Ratio (HAR) AFM Probes
  • ScanAsyst ®** PeakForce Tapping™** AFM Probes
  • Silicon Nitride AFM Probes
  • Lateral Force Microscopy (LFM) AFM Probes
  • Tipless AFM Cantilevers and Cantilever Arrays
  • Plateau AFM Tips
  • Colloidal AFM Probes
  • Self-Sensing & Self-Actuating AFM Probes
  • Sphere AFM Tips
  • Functionalized / Modified / Chemical AFM Probes
  • Platinum Silicide AFM Probes
  • Scanning Thermal Microscopy AFM Probes
  • Premounted AFM Probes
  • Search by AFM Probes properties:

    Force constant: from: to: N/m *Valid range from: to:
    Resonance Frequency: from: to: kHz *Valid range from: to:

    Cantilever shape:
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    AFM Probe coating:

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